Parasitic extraction: current state of the art and future trends

With the increase in circuit performance (higher speeds) and density (smaller feature size) in deep submicrometer (DSM) designs, interconnect parasitic effects are increasingly becoming more important. This paper first surveys the state of the art in parasitic extraction for resistance, capacitance, and inductance. The paper then covers other related issues such as interconnect modeling, model order reduction, delay calculation, and signal integrity issues such as crosstalk. Some future trends on parasitic extraction, model reduction and interconnect modeling are discussed and a fairly complete list of references is given.